Impact wear of multiplated electrical contacts

Wear scars were inflicted on multiplated electrical contacts using a pivotal hammering impact wear tester. The stages of wear life were: plastic deformation, zero wear and measurable wear. Multiplated circuit boards were used as the specimens. The first sandwich top to bottom was 0.1 micrometers Au,...

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Bibliographic Details
Published in:Wear 1995-03, Vol.181-183 (2), p.730-742
Main Author: Engel, P
Format: Article
Language:English
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Summary:Wear scars were inflicted on multiplated electrical contacts using a pivotal hammering impact wear tester. The stages of wear life were: plastic deformation, zero wear and measurable wear. Multiplated circuit boards were used as the specimens. The first sandwich top to bottom was 0.1 micrometers Au, 1.5 micrometer Pd-Ni, and 10 micrometers Cu. The second sandwich tested was 1 micrometer Au, 3.75 micrometers Pd-Ni, 2.5 micrometers Ni, and 10 micrometers Cu. The substrate in both samples was a 25 micrometer peel-apart Cu layer on a 1.9 mm thick epoxy-glass printed circuit board. Only the final stage produced wear debris leading to mass loss.
ISSN:0043-1648
DOI:10.1016/0043-1648(94)07105-5