Certain features of high-dose and intensive implantation of aluminium ions in iron

Using a proton microbeam proton-induced X-ray emission (PIXE) and RBS, a formation of local surface segregations of Al in an Fe layer, has been found for the first time at an initial stage of high-dose intensive implantation (from 8×10 16 to 2×10 17 cm −2 dose irradiation). Using a slow positron bea...

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Bibliographic Details
Published in:Surface & coatings technology 1998-11, Vol.110 (1), p.35-39
Main Authors: Pogrebnjak, A.D, Shablia, V.T, Pogrebnjak, N.A, Sandrik, R, Zecca, A, Bratushka, S.N
Format: Article
Language:English
Subjects:
Amorphization
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Doping and impurity implantation in other materials
Exact sciences and technology
Ion implantation
Metals. Metallurgy
Physics
Segregation
Structure of solids and liquids
crystallography
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Summary:Using a proton microbeam proton-induced X-ray emission (PIXE) and RBS, a formation of local surface segregations of Al in an Fe layer, has been found for the first time at an initial stage of high-dose intensive implantation (from 8×10 16 to 2×10 17 cm −2 dose irradiation). Using a slow positron beam, a profile of vacancy defects, whose depth is comparable with a depth profile of Al ions implanted into Fe with 5×10 17 cm −2 dose implantation, has been measured. The revealed regions with a local surface segregation of Al turned out to be partially amorphized after 2×10 17 cm −2 dose irradiation, according to conversion electron Mossbauer spectra (CEMS) measurements.
ISSN:0257-8972
1879-3347
DOI:10.1016/S0257-8972(98)00577-5