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Corrigendum: Plasma nitriding of Ti-6Al-4V alloy to improve some tribological properties

Some amendments are needed for the above paper. It should be noted that the NRA technique was used for nitrogen measurement in the surface vicinity of the work-pieces only and its contribution to the main article is considerably small, as the tribological properties of the sample surfaces are the ma...

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Bibliographic Details
Published in:Surface & coatings technology 1998-07, Vol.106 (1), p.81-81
Main Authors: Yilbas, B S, Zahin, A Z, Al-Garni, Z, Said, S A M, Ahmed, Z, Abdulaleem, B J, Sami, M
Format: Article
Language:English
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Summary:Some amendments are needed for the above paper. It should be noted that the NRA technique was used for nitrogen measurement in the surface vicinity of the work-pieces only and its contribution to the main article is considerably small, as the tribological properties of the sample surfaces are the main contribution in the paper. In addition, the Nuclear Reaction Technique was new to the principal author at the time of manuscript preparation. Therefore the principal author would like to request that the following points be considered for the amendment. Figure 1, which was mistakenly represented as the mu -NRA result, is wrong. This is due to the fact that the nitrogen depth profile using this research technique (beam normal to the surface) is limited to about a couple of mu m. On the other hand, the hardness profile (Figure 6 in the paper) could indicate that the nitrogen diffusion may extend well below 20 mu m in the substrate. In addition, in the conclusion, the statement about the nitrogen concentration variation along the depth is not strictly correct. Therefore, the NRA technique and related results, i.e. the experimental section, sixth paragraph, the NRA technique, Figure 1 and the second paragraph in the discussion section, need to be disregarded in this manuscript. Moreover, the first conclusion of the paper needs to be changed to read: It may be observed from the hardness profiles and SEM micrographs that the nitrogen diffusion depth in the substrate may increase with incresaing temperature and the nitrogen depth profile may extend well below 20 mu m in the substrate.
ISSN:0257-8972