An update on scanning force microscopies

Simple, low-maintenance instrumentation can be used to image virtually any material at the microscopic and nanoscopic level. The evolution of the atomic force microscope and its many variations and survey applications in chemistry, physics and biology are described.

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Bibliographic Details
Published in:Analytical chemistry (Washington) 1995-05, Vol.67 (9), p.297A-303A
Main Authors: Louder, Darrell R., Parkinson, Bruce A.
Format: Article
Language:English
Subjects:
Atomic force microscopes
Biology
Chemistry
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Microscopes
Physics
Scanning probe microscopes, components and techniques
Scientific imaging
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Description
Summary:Simple, low-maintenance instrumentation can be used to image virtually any material at the microscopic and nanoscopic level. The evolution of the atomic force microscope and its many variations and survey applications in chemistry, physics and biology are described.
ISSN:0003-2700
1520-6882
DOI:10.1021/ac00105a001