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High temperature characteristics of GaN-based heterojunction bipolar transistors and bipolar junction transistors
GaN Bipolar Junction Transistors and GaN/AlGaN Heterojunction Bipolar Transistors were characterized at temperatures up to 250–300°C and power densities >10 kW cm −2. The breakdown voltage in both types of devices decreased at higher temperatures, with less degradation in the BJTs. At low current...
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Published in: | Solid-state electronics 2000-04, Vol.44 (4), p.649-654 |
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Main Authors: | , , , , , , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | GaN Bipolar Junction Transistors and GaN/AlGaN Heterojunction Bipolar Transistors were characterized at temperatures up to 250–300°C and power densities >10 kW cm
−2. The breakdown voltage in both types of devices decreased at higher temperatures, with less degradation in the BJTs. At low current levels, the offset voltages were 2–3 V but increased at higher currents. |
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ISSN: | 0038-1101 1879-2405 |
DOI: | 10.1016/S0038-1101(99)00291-9 |