Lattice parameters and thermal expansion of GaN

Neutron powder diffraction methods with Rietveld analysis are utilized to determine GaN lattice parameters from 15 to 298.1 K. Using these measurements and literature data, we calculated the thermal expansion of gallium nitride (GaN) and predicted its higher temperature thermal expansion. The result...

Full description

Saved in:
Bibliographic Details
Published in:Journal of materials research 2000-01, Vol.15 (1), p.40-44
Main Authors: Reeber, Robert R., Wang, Kai
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Neutron powder diffraction methods with Rietveld analysis are utilized to determine GaN lattice parameters from 15 to 298.1 K. Using these measurements and literature data, we calculated the thermal expansion of gallium nitride (GaN) and predicted its higher temperature thermal expansion. The results are compared with available experimental data and earlier work.
ISSN:0884-2914
2044-5326
DOI:10.1557/JMR.2000.0011