Matrix characterization using synchrotron radiation x-ray diffraction

• Published in: Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2000-06, Vol.61 (3-6), p.739-741
• Main Authors: Barroso, R C, Anjos, M J, Lopes, R T, De Jesus, E F O, Simabuco, S M, Braz, D, Castro, C R F
• Format: Article
• Language: English
• ISSN: 0969-806X

X-ray spectrometry is a non-destructive and multi-elemental technique widely used for elemental analysis. This technique has inherent complexities for quantitative analysis because of matrix effects. Matrix absorption is the most important determining factor when accurate measurements are required for thick samples. Therefore, new methods have to be developed in order to evaluate matrix effects. In this work, the feasibility of using the synchrotron x-ray diffraction for matrix characterization has been investigated. All measurements were performed at the Laboratorio Nacional de Luz S'incrotron (LNLS), in Campinas, Brazil. Diffraction patterns for boric acid and cellulose matrix containing different oxides were recorded. The preliminary results encourage us to examine further the application of x-ray diffraction analysis combined with energy-dispersive x-ray fluorescence analysis for characterization of thick samples.