Improved fault diagnosis in scan-based BIST via superposition

An improved approach for diagnosis of scan-based BIST designs is proposed. The enhancement in diagnosis is achieved by utilizing the superposition principle. Scan cells are partitioned pseudorandomly for observation and the ones provably fault free are removed from the potentially faulty list. Diagn...

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Bibliographic Details
Main Authors: Bayraktaroglu, Ismet, Orailoğlu, Alex
Format: Conference Proceeding
Language:English
Subjects:
Applied computing > Physical sciences and engineering > Engineering
Automatic testing
Built-in self-test
Circuit faults
Compaction
Computer science
Design engineering
Fault diagnosis
Hardware > Emerging technologies
Hardware > Hardware test
Hardware > Hardware validation
Hardware > Robustness
Logic testing
Polynomials
Programmable logic arrays
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Description
Summary:An improved approach for diagnosis of scan-based BIST designs is proposed. The enhancement in diagnosis is achieved by utilizing the superposition principle. Scan cells are partitioned pseudorandomly for observation and the ones provably fault free are removed from the potentially faulty list. Diagnostic resolution is improved by a novel application of the superposition principle, resulting in significant reductions in diagnosis time.
ISSN:0738-100X
DOI:10.1145/337292.337311