Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence

Picosecond imaging circuit analysis (PICA) is recently demonstrated to be a practical measurement technique of internal timing of ICs. This paper describes application of PICA to analysis of individual MOSFET switching times in the L1 cache write control circuits of the S/390 G6 microprocessor chip.

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Bibliographic Details
Main Authors: Polonsky, S., Knebel, D., Sanda, P., McManus, M., Huott, W., Pelella, A., Manzer, D., Steen, S., Wilson, S., Yuen Chan
Format: Conference Proceeding
Language:English
Subjects:
Microprocessors
MOSFET circuits
Nonlinear optics
Optical devices
Optical distortion
Semiconductor device measurement
Shape
Stimulated emission
Switching circuits
Timing
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Description
Summary:Picosecond imaging circuit analysis (PICA) is recently demonstrated to be a practical measurement technique of internal timing of ICs. This paper describes application of PICA to analysis of individual MOSFET switching times in the L1 cache write control circuits of the S/390 G6 microprocessor chip.
ISSN:0193-6530
2376-8606
DOI:10.1109/ISSCC.2000.839758