Ion-Induced Secondary Electron Emission Coefficient (γ) of Bulk-MgO Single Crystals

The ion induced secondary electron emission coefficient γ of bulk-MgO single crystal has been measured by the γ-focused ion beam system. It is found that the bulk-MgO single crystal with (111) orientation has the highest γ from 0.08 up to 0.21, and the γ values are in the order of the crystallinitie...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2000, Vol.39 (4R), p.1890-1891
Main Authors: Kim, Dae-Il, Lim, Jae-Yong, Kim, Young-Guon, Ko, Jae-Jun, Lee, Choon-Woo, Cho, Guang-Sup, Choi, Eun-Ha
Format: Article
Language:English
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Summary:The ion induced secondary electron emission coefficient γ of bulk-MgO single crystal has been measured by the γ-focused ion beam system. It is found that the bulk-MgO single crystal with (111) orientation has the highest γ from 0.08 up to 0.21, and the γ values are in the order of the crystallinities, (111) > (200) > (220) for operating Ne + ions ranging from 50 eV to 300 eV in this experiment. These results are consistent with our previous reports for MgO protective layers with respective orientations of (111), (200), and (220).
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.39.1890