In situ high temperature x-ray diffraction measurements on a (TiO sub 2 ) sub 0.18 (SiO sub 2 ) sub 0.82 xerogel using a curved image-plate

In situ high temperature x-ray diffraction measurements have been performed on a (TiO sub 2 ) sub 0.18 (SiO sub 2 ) sub 0.82 xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fou...

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Bibliographic Details
Published in:Journal of physics. Condensed matter 2000-04, Vol.12 (15), p.3521-3529
Main Authors: Pickup, D M, Mountjoy, G, Roberts, M A, Wallidge, G W, Newport, R J, Smith, M E
Format: Article
Language:English
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Summary:In situ high temperature x-ray diffraction measurements have been performed on a (TiO sub 2 ) sub 0.18 (SiO sub 2 ) sub 0.82 xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fourfold as the temperature is increased from 25 deg C to 310 deg C. An increase in the average O-O distance associated with this change is also identified. The use of the curved image-plate is shown to be a valuable technique for in situ studies of structural changes associated with thermal treatment of materials.
ISSN:0953-8984