A novel algorithm to extract two-node bridges

Defect based testing is based on the premise that it is possible to extract high probability defects viz. bridges and opens using layout and defect data. We present a very efficient algorithm to extract two-node bridges from layout. Comparison results with a popular tool show that our algorithm is c...

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Bibliographic Details
Main Authors: Zachariah, Sujit T., Chakravarty, Sreejit, Roth, Carl D.
Format: Conference Proceeding
Language:English
Subjects:
Algorithm design and analysis
Applied computing > Physical sciences and engineering > Engineering
Bridge circuits
Circuit faults
Circuit testing
Computer systems organization > Dependable and fault-tolerant systems and networks
Data mining
General and reference > Cross-computing tools and techniques > Performance
Hardware > Emerging technologies
Hardware > Robustness
Hardware > Very large scale integration design
Integrated circuit modeling
Integrated circuit testing
Microprocessors
Networks > Network performance evaluation
Permission
Statistical analysis
Online Access:Get full text
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Description
Summary:Defect based testing is based on the premise that it is possible to extract high probability defects viz. bridges and opens using layout and defect data. We present a very efficient algorithm to extract two-node bridges from layout. Comparison results with a popular tool show that our algorithm is considerably faster and that it has higher capacity.
ISSN:0738-100X
DOI:10.1145/337292.337780