On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction

Uses data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect bridging surrogates. We show that the coefficient of correlation between these tests approaches zero as the stuck-at fault coverage approaches 100%...

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Bibliographic Details
Main Authors: Dworak, J., Grimaila, M.R., Cobb, B., Wang, T.-C., Wang, L.-C., Mercer, M.R.
Format: Conference Proceeding
Language:English
Subjects:
Benchmark testing
Circuit faults
Circuit testing
Electrical fault detection
Fault detection
Integrated circuit testing
Logic circuits
Logic testing
Pattern analysis
Predictive models
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Description
Summary:Uses data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect bridging surrogates. We show that the coefficient of correlation between these tests approaches zero as the stuck-at fault coverage approaches 100%. An enhanced version of the MPG-D model, which is based upon the number of detections of each site in a logic circuit, is shown to be superior to stuck-at fault coverage-based defective part level prediction. We then compare the accuracy of both predictors for an industrial circuit tested using two different test pattern sequences.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2000.893618