Recrystallization Dynamics of Phase Change Optical Disks with a Nitrogen Interface Layer

The recrystallization velocity of a phase change material is measured in real time by observing the reflected laser power during the interaction of the laser with the sample. This technique is applied to compare the recrystallization behavior of phase change optical disk media with and without a nit...

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Bibliographic Details
Published in:JPN J APPL PHYS PART 1 REGUL PAP SHORT NOTE REV PAP 2000, Vol.39 (2S), p.766-769
Main Authors: Trappe, Cyril, Béchevet, Bernard, Hyot, Bérangère, Winkler, Olaf, Facsko, Stefan, Kurz, Heinrich
Format: Article
Language:English
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Summary:The recrystallization velocity of a phase change material is measured in real time by observing the reflected laser power during the interaction of the laser with the sample. This technique is applied to compare the recrystallization behavior of phase change optical disk media with and without a nitride interface layer. It is shown that the enhanced cyclability induced by the nitride interface layer is correlated to an enhancement of the recrystallization velocity. The experimental determination of temperature profiles induced by laser pulses, combined with the numerical integration of the crystallization rate equations, leads to a quantitative interpretation of the observed recrystallization dynamics.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.39.766