Short circuit current vs cell thickness in solar cells under rear illumination: a direct evaluation of the diffusion length

The dependence of the short circuit current of a solar cell with its thickness is analysed for rear illumination. Under certain conditions, a simple linear regression in a semilogarithm scale is found. Using these results, an almost direct evaluation of the minority carrier diffusion length in the b...

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Bibliographic Details
Published in:Solid-state electronics 2000-04, Vol.44 (4), p.719-724
Main Authors: Plá, J.C., Tamasi, M.J.L., Bolzi, C.G., Venier, G.L., Durán, J.C.
Format: Article
Language:English
Subjects:
Diffusion length
Silicon solar cells
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Summary:The dependence of the short circuit current of a solar cell with its thickness is analysed for rear illumination. Under certain conditions, a simple linear regression in a semilogarithm scale is found. Using these results, an almost direct evaluation of the minority carrier diffusion length in the base region of crystalline silicon solar cells is achieved. On the other hand, from the experimental point of view, monochromatic light is not required and the equipment requirements are minimised. The model presented in this paper is theoretically evaluated using a 1-dimensional simulation code. Some preliminary experimental results are also shown.
ISSN:0038-1101
1879-2405
DOI:10.1016/S0038-1101(99)00311-1