Raman Spectroscopy of Nanocrystalline Ceria and Zirconia Thin Films

The results of Raman‐scattering studies of nanocrystalline CeO2 and ZrO2:16% Y (YSZ) thin films are presented. The relationship between the lattice disorder and the form of the Raman spectra is discussed and correlated with the microstructure. It is shown that the Raman line shape results from phono...

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Bibliographic Details
Published in:Journal of the American Ceramic Society 2002-11, Vol.85 (11), p.2646-2650
Main Authors: Kosacki, Igor, Petrovsky, Vladimir, Anderson, Harlan U., Colomban, Philippe
Format: Article
Language:English
Subjects:
cerium/cerium compounds
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Defects and impurities: doping, implantation, distribution, concentration, etc
Exact sciences and technology
Materials science
nanoparticulates
Nanoscale materials and structures: fabrication and characterization
nonstoichiometry
Physics
Raman spectroscopy
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
thin films
zirconia
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Summary:The results of Raman‐scattering studies of nanocrystalline CeO2 and ZrO2:16% Y (YSZ) thin films are presented. The relationship between the lattice disorder and the form of the Raman spectra is discussed and correlated with the microstructure. It is shown that the Raman line shape results from phonon confinement and spatial correlation effects and yields information about the material nonstoichiometry level.
ISSN:0002-7820
1551-2916
DOI:10.1111/j.1151-2916.2002.tb00509.x