A simple procedure to determine the complex permittivity of materials without ambiguity from reflection measurements

A new simple and fast procedure to calculate the dielectric properties of materials without ambiguity has been developed by transforming one‐port reflection measurements, made by an automatic network analyzer, into permittivity values. The measurements needed for the dielectric characterization are...

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Bibliographic Details
Published in:Microwave and optical technology letters 2000-05, Vol.25 (3), p.191-194
Main Authors: Catalá-Civera, J. M., Peñaranda-Foix, F., Sánchez-Hernández, D., De los Reyes, E.
Format: Article
Language:English
Subjects:
dielectric characterization
microwave measurements
short-circuited lines
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Summary:A new simple and fast procedure to calculate the dielectric properties of materials without ambiguity has been developed by transforming one‐port reflection measurements, made by an automatic network analyzer, into permittivity values. The measurements needed for the dielectric characterization are taken from two samples of different lengths embedded inside two short‐circuited waveguides with a length relation of 1:n. The technique is validated by good agreement with previously reported results. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 25: 191–194, 2000.
ISSN:0895-2477
1098-2760
DOI:10.1002/(SICI)1098-2760(20000505)25:3<191::AID-MOP10>3.0.CO;2-5