Estimation of the reliability of digital systems implemented on programmable devices

• Published in: Microelectronics and reliability 2000-12, Vol.40 (12), p.2087-2093
• Main Authors: Vasiltsov, Igor V., A. Mandziy, Bogdan
• Format: Article
• Language: English
• ISSN: 0026-2714; 1872-941X
• DOI: 10.1016/S0026-2714(00)00020-2

In this paper, the authors propose to use the functional reliability parameters as a criterion for consistent choice of a project solution on the basis of the forecast reliability parameters. The authors take into account the failures as the main reason of incorrect performance of the designed digital systems, implemented on programmable devices. The electromagnetic parasitic noises arising in the microelectronics chip is one of the main reason of failure occurrences. Their influence on the reliability parameters of the designed project has been determined. Mathematical models (MM) of internal noises have been developed. On the basis of these MM and with the noise immunity margin as well, the developer is able to estimate the functional reliability parameters of logic gate at single switching. The received evaluations of the failure probabilities are accepted as the basic characteristics and are used hereinafter when evaluating the probability of correct functioning of a designed project. The obtained reliability parameters permit the developer to choose the optimal architecture of the designed project by comparing the alternative variants. For practical realization of the proposed approach, the software subsystem “FunNad-2” has been developed.