Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes

We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor ( α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effectiv...

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Bibliographic Details
Published in:Optics communications 2000, Vol.173 (1), p.303-309
Main Authors: Shin, Yun Sup, Yoon, Tai Hyun, Park, Jong Rak, Nam, Chang Hee
Format: Article
Language:English
Subjects:
Compound cavity
Effective reflectivity
Exact sciences and technology
External cavity laser diode
External feedback
Fundamental areas of phenomenology (including applications)
Half wave plate
Lasers
Linewidth enhancement factor
Optics
Physics
Semiconductor lasers
laser diodes
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Summary:We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor ( α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivity is used to determine the value of α in the current scanning method and in the reflectivity scanning method, respectively. The measured values of α by the two methods showed a fairly good agreement.
ISSN:0030-4018
1873-0310
DOI:10.1016/S0030-4018(99)00589-1