Texture of PAN- and pitch-based carbon fibers

The new technique of scanning microbeam X-ray diffraction is used to get information about the axial as well as the cross-sectional crystallographic texture of single PAN- and mesophase-pitch-based carbon fibers. The resulting preferred orientation in the axial direction is considerably higher than...

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Bibliographic Details
Published in:Carbon (New York) 2002-04, Vol.40 (4), p.551-555
Main Authors: Paris, Oskar, Loidl, Dieter, Peterlik, Herwig
Format: Article
Language:English
Subjects:
A. Carbon fibers
Applied sciences
Building materials. Ceramics. Glasses
C. X-ray diffraction
Ceramic and carbon fibers
Ceramic industries
Chemical industry and chemicals
D. Textures
Exact sciences and technology
Technical ceramics
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Summary:The new technique of scanning microbeam X-ray diffraction is used to get information about the axial as well as the cross-sectional crystallographic texture of single PAN- and mesophase-pitch-based carbon fibers. The resulting preferred orientation in the axial direction is considerably higher than the values obtained from conventional X-ray diffraction measurements on fiber bundles. A change in azimuthal width of the 002 reflection was observed across some of the fibers, which can be attributed to a radial folded cross-sectional texture for pitch-based fibers, and to a different preferred orientation of skin and core layers for PAN-based fibers.
ISSN:0008-6223
1873-3891
DOI:10.1016/S0008-6223(01)00139-7