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Wafer-scale nanostructured black silicon with morphology engineering via advanced Sn-assisted dry etching for sensing and solar cell applications
Black-Si (b-Si) providing broadband light antireflection has become a versatile substrate for photodetectors, photo-electric catalysis, sensors, and photovoltaic devices. However, the conventional fabrication methods suffer from single morphology, low yield, or frangibility. In this work, we present...
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Published in: | Nanoscale 2023-03, Vol.15 (10), p.4843-4851 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Black-Si (b-Si) providing broadband light antireflection has become a versatile substrate for photodetectors, photo-electric catalysis, sensors, and photovoltaic devices. However, the conventional fabrication methods suffer from single morphology, low yield, or frangibility. In this work, we present a high-yield CMOS-compatible technique to produce 6-inch wafer-scale b-Si with diverse random nanostructures. b-Si is achieved by O
/SF
plasma-based reactive ion etching (RIE) of the Si wafer which is coated with a GeSn layer. A stable grid of the SnO
F
layer, formed during the initial GeSn etching, acts as a self-assembled hard mask for the formation of subwavelength Si nanostructures. b-Si wafers with diverse surface morphologies, such as the nanopore, nanocone, nanohole, nanohillock, and nanowire were achieved. Furthermore, the responsivity of the b-Si metal-semiconductor-metal (MSM) photodetector in the near-infrared (NIR) wavelength range (1000-1200 nm) is 40-200% higher than that of a planar-Si MSM photodetector with the same level of dark current, which is beneficial for applications in photon detectors, solar cells, and photocatalysis. This work not only demonstrates a new non-lithography method to fabricate wafer-scale b-Si wafers, but may also provide a novel strategy to fabricate other nanostructured surface materials (
, Ge or III-V based compounds) with morphology engineering. |
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ISSN: | 2040-3364 2040-3372 |
DOI: | 10.1039/d2nr06493f |