Atomic force microscopy studies of molded thin films of segmented polyamides

The surface morphology of molded thin film of segmented polyamides has been studied by atomic force microscopy along with transmission electron microscopy.The morphology basically consists of the "plateaus" of hard polyamide blocks and the "plains" of soft polyether segments. The...

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Bibliographic Details
Published in:Journal of materials science letters 2000-12, Vol.19 (23), p.2161-2165
Main Authors: GHOSH, Subiman, KHASTAGIR, D, BHOWMICK, A. K, BANDYOPADHYAY, S, KAO, G. J. P, KOK, L
Format: Article
Language:English
Subjects:
Applied sciences
Exact sciences and technology
Organic polymers
Physicochemistry of polymers
Properties and characterization
Structure, morphology and analysis
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Summary:The surface morphology of molded thin film of segmented polyamides has been studied by atomic force microscopy along with transmission electron microscopy.The morphology basically consists of the "plateaus" of hard polyamide blocks and the "plains" of soft polyether segments. The size of the near spherical particles of the hard polyamide phase are found to be same in both the methods, i.e., 600 nm in the case of the M sub H2300 polymer. The section analysis of the images obtained by AFM has revealed that the surface and vertical distances depend upon the angle of the line profile to the horizontal surface. The surface distance, vertical distance and size of the elevated polyamide domains are found to decrease with either decrease in hard block molecular weight or increase in soft segment molecular weight.
ISSN:0261-8028
DOI:10.1023/A:1026751532038