Z-scan determination of the large third-order optical nonlinearity of Rh:BaTiO sub(3) thin films deposited on MgO substrates

Highly c-axis oriented Rh-doped BaTiO sub(3) thin films were grown on MgO (1 0 0) substrates by pulsed laser deposition using a single-crystal Rh:BaTiO sub(3) target. The 150-nm thick films were deposited at 800 degree C under the oxygen pressure of 7 x 10 super(-2) Pa. The structural properties of...

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Published in:Optics communications 2002-08, Vol.209 (4-6), p.445-449
Main Authors: Yang, Guang, Wang, Weitian, Yan, Lei, Lu, Huibing, Yang, Guozhen, Chen, Zhenghao
Format: Article
Language:English
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Summary:Highly c-axis oriented Rh-doped BaTiO sub(3) thin films were grown on MgO (1 0 0) substrates by pulsed laser deposition using a single-crystal Rh:BaTiO sub(3) target. The 150-nm thick films were deposited at 800 degree C under the oxygen pressure of 7 x 10 super(-2) Pa. The structural properties of the samples were characterized by X-ray diffraction and atomic force microscopy. The full width at half maximum of the (0 0 2) Rh:BaTiO sub(3) rocking curve and the root-mean-square surface roughness within the 5 x 5 mu m super(2) area were 0.520 degree and 0.85 nm, respectively. The nonlinear optical properties of the films were determined by a single beam Z-scan at a wavelength of 532 nm with laser duration of 10 ns. The result shows that Rh:BaTiO sub(3) thin films exhibit a great nonlinear optical response with the real and imaginary parts of the third-order nonlinear optical susceptibility Chi super((3)) being 3.59 x 10 super(-7) esu and 4.01 x 10 super(-8) esu, respectively. copyright 2002 Elsevier Science B.V. All rights reserved.
ISSN:0030-4018