Characterization of defects in monocrystalline CVD diamond films by electron spin resonance

Electron spin resonance (ESR) measurements on free-standing monocrystalline CVD diamond samples allowed us to deduce the symmetry of the previously reported KUL1 and KUL3 centers as trigonal and monoclinic-I, respectively. Based on the correlation between the intensities of the KUL3 ESR signals and...

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Bibliographic Details
Published in:Diamond and related materials 2003-03, Vol.12 (3), p.511-515
Main Authors: Iakoubovskii, K., Stesmans, A., Suzuki, K., Kuwabara, J., Sawabe, A.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Defect characterization
Defects and impurities: doping, implantation, distribution, concentration, etc
Diamond film
Exact sciences and technology
Fullerenes and related materials
diamonds, graphite
Impurities
Materials science
Physics
Specific materials
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:Electron spin resonance (ESR) measurements on free-standing monocrystalline CVD diamond samples allowed us to deduce the symmetry of the previously reported KUL1 and KUL3 centers as trigonal and monoclinic-I, respectively. Based on the correlation between the intensities of the KUL3 ESR signals and of the 1.68 eV Si-related luminescence peak, and on the analysis of the observed hyperfine interaction structure, the KUL3 center is suggested to involve one Si and one hydrogen atom. Two previously undocumented centers, labeled as KUL16 and KUL17, have been characterized and attributed to two 〈100〉-oriented surface defects, each involving one hydrogen atom.
ISSN:0925-9635
1879-0062
DOI:10.1016/S0925-9635(02)00380-1