Confinement of Shockley states in ultra thin films of Ag on Cu(111)

• Published in: Thin solid films 2003-03, Vol.428 (1), p.119-122
• Main Authors: Bendounan, A., Cercellier, H., Fagot-Revurat, Y., Kierren, B., Yurov, V.Yu, Malterre, D.
• Format: Article
• Language: English
• Subjects: Angle resolved photoemission; Applied sciences; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Electron, ion, and scanning probe microscopy; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Exact sciences and technology; Metals. Metallurgy; Physics; Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc; Scanning tunneling microscopy; Structure and morphology; thickness; Structure of solids and liquids; crystallography; Surface and interface electron states; Surface electronic properties; Surface states, band structure, electron density of states; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/S0040-6090(02)01233-6

Shockley surface states have been studied in Ag epitaxial ultra-thin films on Cu(111) by angle-resolved photoemission (ARPES), scanning tunneling microscopy (STM) and spectroscopy (STS). The morphology of these films is characterized by large Ag islands growing along the step edges of the substrate. In the submonolayer range, the two spectroscopic techniques indicate the existence of two surface states associated with the Cu terraces and the Ag islands suggesting the confinement of the electronic states. Moreover, two different atomic reconstructions depending on the preparation temperature have been evidenced and lead to different surface state energies.