Current distribution measurement in YBCO thin film for a superconducting fault current limiter

Current distribution in the superconducting film for a resistive fault current limiter is important, because it influences AC loss and a uniformity of S/N transition. The lateral current distribution of the film was reconstructed from the magnetic field distribution which is measured by multiple Hal...

Full description

Saved in:
Bibliographic Details
Published in:Cryogenics (Guildford) 2003-02, Vol.43 (2), p.111-116
Main Authors: Shimohata, Kenji, Yokoyama, Shoichi, Inaguchi, Takashi, Nakamura, Shiro, Ozawa, Yasuo
Format: Article
Language:English
Subjects:
Applied sciences
Current distribution
Electronics
Exact sciences and technology
Fault current limiter
HTS film
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Superconducting devices
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c434t-2949718564e4fea05d526e694f4e174feb8746fa5e68fb2510afe973daf396293
cites cdi_FETCH-LOGICAL-c434t-2949718564e4fea05d526e694f4e174feb8746fa5e68fb2510afe973daf396293
container_end_page 116
container_issue 2
container_start_page 111
container_title Cryogenics (Guildford)
container_volume 43
creator Shimohata, Kenji
Yokoyama, Shoichi
Inaguchi, Takashi
Nakamura, Shiro
Ozawa, Yasuo
description Current distribution in the superconducting film for a resistive fault current limiter is important, because it influences AC loss and a uniformity of S/N transition. The lateral current distribution of the film was reconstructed from the magnetic field distribution which is measured by multiple Hall probes. The following results were obtained. (1) Non-uniform current distribution in the superconducting film was observed when the current was less than 1.3 times of critical current ( I c). (2) The current in a superconducting film was uniform when the current was much higher than I c. The current can be considered uniform when the film works as a fault current limiter, because the S/N transition starts about twice of I c. (3) The validity of the measurement was verified by the comparison with the electric circuit simulation.
doi_str_mv 10.1016/S0011-2275(03)00048-1
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_27824007</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0011227503000481</els_id><sourcerecordid>27824007</sourcerecordid><originalsourceid>FETCH-LOGICAL-c434t-2949718564e4fea05d526e694f4e174feb8746fa5e68fb2510afe973daf396293</originalsourceid><addsrcrecordid>eNqFkMtKBDEQRYMoOI5-gpCNoovWvDrpXokOvmBgFurCjSGTrmikH2OSFvx7u51Bl66quHXqFnUROqTkjBIqzx8IoTRjTOUnhJ8SQkSR0S00oYUqB5nn22jyi-yivRjfR4hJNkEvsz4EaBOufEzBL_vkuxY3YGIfoBkHvsXPV7MFTm9D53zdYNcFbHDsVxBs11a9Tb59xc70dcJ2Y1f7xicI-2jHmTrCwaZO0dPN9ePsLpsvbu9nl_PMCi5SxkpRKlrkUoBwYEhe5UyCLIUTQNUgLQslpDM5yMItWU6JcVAqXhnHS8lKPkXHa99V6D56iEk3Plqoa9NC10fNVMEEIWoA8zVoQxdjAKdXwTcmfGlK9Jim_klTj1FpwvVPmpoOe0ebAyZaU7tgWuvj37KQkkouBu5izcHw7aeHoKP10FqofACbdNX5fy59AzAkibg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27824007</pqid></control><display><type>article</type><title>Current distribution measurement in YBCO thin film for a superconducting fault current limiter</title><source>ScienceDirect Journals</source><creator>Shimohata, Kenji ; Yokoyama, Shoichi ; Inaguchi, Takashi ; Nakamura, Shiro ; Ozawa, Yasuo</creator><creatorcontrib>Shimohata, Kenji ; Yokoyama, Shoichi ; Inaguchi, Takashi ; Nakamura, Shiro ; Ozawa, Yasuo</creatorcontrib><description>Current distribution in the superconducting film for a resistive fault current limiter is important, because it influences AC loss and a uniformity of S/N transition. The lateral current distribution of the film was reconstructed from the magnetic field distribution which is measured by multiple Hall probes. The following results were obtained. (1) Non-uniform current distribution in the superconducting film was observed when the current was less than 1.3 times of critical current ( I c). (2) The current in a superconducting film was uniform when the current was much higher than I c. The current can be considered uniform when the film works as a fault current limiter, because the S/N transition starts about twice of I c. (3) The validity of the measurement was verified by the comparison with the electric circuit simulation.</description><identifier>ISSN: 0011-2275</identifier><identifier>EISSN: 1879-2235</identifier><identifier>DOI: 10.1016/S0011-2275(03)00048-1</identifier><identifier>CODEN: CRYOAX</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Applied sciences ; Current distribution ; Electronics ; Exact sciences and technology ; Fault current limiter ; HTS film ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Superconducting devices</subject><ispartof>Cryogenics (Guildford), 2003-02, Vol.43 (2), p.111-116</ispartof><rights>2003 Elsevier Science Ltd</rights><rights>2003 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c434t-2949718564e4fea05d526e694f4e174feb8746fa5e68fb2510afe973daf396293</citedby><cites>FETCH-LOGICAL-c434t-2949718564e4fea05d526e694f4e174feb8746fa5e68fb2510afe973daf396293</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=14661634$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Shimohata, Kenji</creatorcontrib><creatorcontrib>Yokoyama, Shoichi</creatorcontrib><creatorcontrib>Inaguchi, Takashi</creatorcontrib><creatorcontrib>Nakamura, Shiro</creatorcontrib><creatorcontrib>Ozawa, Yasuo</creatorcontrib><title>Current distribution measurement in YBCO thin film for a superconducting fault current limiter</title><title>Cryogenics (Guildford)</title><description>Current distribution in the superconducting film for a resistive fault current limiter is important, because it influences AC loss and a uniformity of S/N transition. The lateral current distribution of the film was reconstructed from the magnetic field distribution which is measured by multiple Hall probes. The following results were obtained. (1) Non-uniform current distribution in the superconducting film was observed when the current was less than 1.3 times of critical current ( I c). (2) The current in a superconducting film was uniform when the current was much higher than I c. The current can be considered uniform when the film works as a fault current limiter, because the S/N transition starts about twice of I c. (3) The validity of the measurement was verified by the comparison with the electric circuit simulation.</description><subject>Applied sciences</subject><subject>Current distribution</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fault current limiter</subject><subject>HTS film</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Superconducting devices</subject><issn>0011-2275</issn><issn>1879-2235</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNqFkMtKBDEQRYMoOI5-gpCNoovWvDrpXokOvmBgFurCjSGTrmikH2OSFvx7u51Bl66quHXqFnUROqTkjBIqzx8IoTRjTOUnhJ8SQkSR0S00oYUqB5nn22jyi-yivRjfR4hJNkEvsz4EaBOufEzBL_vkuxY3YGIfoBkHvsXPV7MFTm9D53zdYNcFbHDsVxBs11a9Tb59xc70dcJ2Y1f7xicI-2jHmTrCwaZO0dPN9ePsLpsvbu9nl_PMCi5SxkpRKlrkUoBwYEhe5UyCLIUTQNUgLQslpDM5yMItWU6JcVAqXhnHS8lKPkXHa99V6D56iEk3Plqoa9NC10fNVMEEIWoA8zVoQxdjAKdXwTcmfGlK9Jim_klTj1FpwvVPmpoOe0ebAyZaU7tgWuvj37KQkkouBu5izcHw7aeHoKP10FqofACbdNX5fy59AzAkibg</recordid><startdate>20030201</startdate><enddate>20030201</enddate><creator>Shimohata, Kenji</creator><creator>Yokoyama, Shoichi</creator><creator>Inaguchi, Takashi</creator><creator>Nakamura, Shiro</creator><creator>Ozawa, Yasuo</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20030201</creationdate><title>Current distribution measurement in YBCO thin film for a superconducting fault current limiter</title><author>Shimohata, Kenji ; Yokoyama, Shoichi ; Inaguchi, Takashi ; Nakamura, Shiro ; Ozawa, Yasuo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c434t-2949718564e4fea05d526e694f4e174feb8746fa5e68fb2510afe973daf396293</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Applied sciences</topic><topic>Current distribution</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fault current limiter</topic><topic>HTS film</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Superconducting devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shimohata, Kenji</creatorcontrib><creatorcontrib>Yokoyama, Shoichi</creatorcontrib><creatorcontrib>Inaguchi, Takashi</creatorcontrib><creatorcontrib>Nakamura, Shiro</creatorcontrib><creatorcontrib>Ozawa, Yasuo</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Cryogenics (Guildford)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shimohata, Kenji</au><au>Yokoyama, Shoichi</au><au>Inaguchi, Takashi</au><au>Nakamura, Shiro</au><au>Ozawa, Yasuo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Current distribution measurement in YBCO thin film for a superconducting fault current limiter</atitle><jtitle>Cryogenics (Guildford)</jtitle><date>2003-02-01</date><risdate>2003</risdate><volume>43</volume><issue>2</issue><spage>111</spage><epage>116</epage><pages>111-116</pages><issn>0011-2275</issn><eissn>1879-2235</eissn><coden>CRYOAX</coden><abstract>Current distribution in the superconducting film for a resistive fault current limiter is important, because it influences AC loss and a uniformity of S/N transition. The lateral current distribution of the film was reconstructed from the magnetic field distribution which is measured by multiple Hall probes. The following results were obtained. (1) Non-uniform current distribution in the superconducting film was observed when the current was less than 1.3 times of critical current ( I c). (2) The current in a superconducting film was uniform when the current was much higher than I c. The current can be considered uniform when the film works as a fault current limiter, because the S/N transition starts about twice of I c. (3) The validity of the measurement was verified by the comparison with the electric circuit simulation.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/S0011-2275(03)00048-1</doi><tpages>6</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0011-2275
ispartof Cryogenics (Guildford), 2003-02, Vol.43 (2), p.111-116
issn 0011-2275
1879-2235
language eng
recordid cdi_proquest_miscellaneous_27824007
source ScienceDirect Journals
subjects Applied sciences
Current distribution
Electronics
Exact sciences and technology
Fault current limiter
HTS film
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Superconducting devices
title Current distribution measurement in YBCO thin film for a superconducting fault current limiter
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T23%3A24%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Current%20distribution%20measurement%20in%20YBCO%20thin%20film%20for%20a%20superconducting%20fault%20current%20limiter&rft.jtitle=Cryogenics%20(Guildford)&rft.au=Shimohata,%20Kenji&rft.date=2003-02-01&rft.volume=43&rft.issue=2&rft.spage=111&rft.epage=116&rft.pages=111-116&rft.issn=0011-2275&rft.eissn=1879-2235&rft.coden=CRYOAX&rft_id=info:doi/10.1016/S0011-2275(03)00048-1&rft_dat=%3Cproquest_cross%3E27824007%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c434t-2949718564e4fea05d526e694f4e174feb8746fa5e68fb2510afe973daf396293%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=27824007&rft_id=info:pmid/&rfr_iscdi=true