On the numerical errors induced by the space-time discretization in the LE-FDTD method

In this work, the accuracy of the lumped element finite-difference time-domain (LE-FDTD) method is discussed in the particular case of a planar distribution of equal resistors. Following the von Neumann technique and assuming a uniform grid, the effective impedance of the lumped resistor has been ri...

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Bibliographic Details
Published in:IEEE microwave and wireless components letters 2003-03, Vol.13 (3), p.131-133
Main Authors: Alimenti, F., Roselli, L.
Format: Article
Language:English
Subjects:
Applied sciences
Discretization
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Exact solutions
Finite difference method
Finite difference methods
Impedance
Loaded waveguides
Mathematical analysis
Mathematical models
Microwaves
Planar waveguides
Reflection
Resistors
Scattering
Testing
Theoretical study. Circuits analysis and design
Time domain analysis
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Summary:In this work, the accuracy of the lumped element finite-difference time-domain (LE-FDTD) method is discussed in the particular case of a planar distribution of equal resistors. Following the von Neumann technique and assuming a uniform grid, the effective impedance of the lumped resistor has been rigorously derived in a closed form. The result obtained has been compared with the LE-FDTD simulation of a simple test structure. This structure consists of an infinitely long parallel-plate waveguide loaded with the planar distribution of resistors. The excellent agreement obtained validates the approach showing a dependence of the effective resistor impedance on spatial and temporal discretization steps.
ISSN:1531-1309
2771-957X
1558-1764
2771-9588
DOI:10.1109/LMWC.2003.810122