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Growth and temperature characteristic of self-assembled InAs-QD on GaInP
The (Al 1− x Ga x ) 0.5In 0.5P/InAs system has a large band discontinuity and is expected to improve the characteristic temperature of QD lasers by embedding InAs-QD in GaInP. We investigated the QD density and size of InAs-QD deposited on GaInP with various growth conditions, namely InAs growth tem...
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Published in: | Journal of crystal growth 2003-04, Vol.251 (1), p.223-229 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The (Al
1−
x
Ga
x
)
0.5In
0.5P/InAs system has a large band discontinuity and is expected to improve the characteristic temperature of QD lasers by embedding InAs-QD in GaInP. We investigated the QD density and size of InAs-QD deposited on GaInP with various growth conditions, namely InAs growth temperature (
T
s=450–500°C) and As-flux (3×10
−7–6×10
−6
mbar) by AFM measurement, and we compared the temperature characteristics of InAs-QD embedded in GaInP with InGaAs-QW in GaInP, InGaAs-QW in GaAs and InAs-QD in GaAs by PL measurement at 10–380
K. The size and total volume of InAs-QD on GaInP increased according to the rise in growth temperature and As-flux, although the amount of deposited InAs was constant. This means that a considerable amount of In was supplied for the QD layer from the GaInP matrix and this was enhanced by the growth temperture and As-flux. Comparing the integrated PL intensity with GaAs/InAs-QD, it was shown that no obvious decline of PL intensity of GaInP/InAs-QD was observed up to around 200
K, though in GaAs/InAs-QD, it began to fall from around 50
K. Moreover, even when comparing with GaAs/InGaAs-QW, the integrated intensity of GaInP/InAs-QD became superior to that of GaAs/InGaAs-QW above room temperature. This result demonstrates that embedding InAs-QD in the GaInP matrix is considerably effective in improving the temperature characteristic of InAs-QD. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/S0022-0248(02)02426-0 |