The fatigue effects in red emissive CdSe based QLED operated around turn-on voltage

The operational stability is a current bottleneck facing the quantum dot light-emitting diodes (QLEDs). In particular, the device working around turn-on voltage suffers from unbalanced charge injection and heavy power loss. Here, we investigate the operational stability of red emissive CdSe QLEDs op...

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Bibliographic Details
Published in:The Journal of chemical physics 2023-04, Vol.158 (13), p.131101-131101
Main Authors: Zhang, Xin, Bao, Hui, Chen, Cuili, Wu, Xian-gang, Li, Menglin, Ji, Wenyu, Wang, Shuangpeng, Zhong, Haizheng
Format: Article
Language:English
Subjects:
Charge injection
Electric potential
Electroluminescence
Equivalent circuits
Heat treatment
Light emitting diodes
Luminance
Photoluminescence
Quantum dots
Stability
Voltage
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Summary:The operational stability is a current bottleneck facing the quantum dot light-emitting diodes (QLEDs). In particular, the device working around turn-on voltage suffers from unbalanced charge injection and heavy power loss. Here, we investigate the operational stability of red emissive CdSe QLEDs operated at different applied voltages. Compared to the rising luminance at higher voltages, the device luminance quickly decreases when loaded around the turn-on voltage, but recovers after unloading or slight heat treatment, which is termed fatigue effects of operational QLED. The electroluminescence and photoluminescence spectra before and after a period of operation at low voltages show that the abrupt decrease in device luminance derives from the reduction of quantum yield in quantum dots. Combined with transient photoluminescence and electroluminescence measurements, as well as equivalent circuit model analysis, the electron accumulation in quantum dots mainly accounts for the observed fatigue effects of a QLED during the operation around turn-on voltage. The underlying mechanisms at the low-voltage working regime will be very helpful for the industrialization of QLED.
ISSN:0021-9606
1089-7690
DOI:10.1063/5.0145471