A high-sensitivity CMOS image sensor with gain-adaptive column amplifiers

A high-sensitivity CMOS image sensor using gain-adaptive column amplifiers is presented and tested. The use of high gain for the column amplifier reduces input-referred random noise, and when coupled with a column-based digital noise cancellation technique, also reduces fixed pattern noise. An exper...

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Bibliographic Details
Published in:IEEE journal of solid-state circuits 2005-05, Vol.40 (5), p.1147-1156
Main Authors: Sakakibara, M., Kawahito, S., Handoko, D., Nakamura, N., Satoh, H., Higashi, M., Mabuchi, K., Sumi, H.
Format: Article
Language:English
Subjects:
Amplifiers
Applied sciences
Circuit noise
Circuit properties
Circuits
CMOS
CMOS image sensors
CMOS technology
column amplifier
Design. Technologies. Operation analysis. Testing
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
gain-adaptive amplifier
High gain
Image sensors
Imaging devices
Integrated circuits
low readout noise
Low-noise amplifiers
Noise
Noise cancellation
Noise level
Noise reduction
Optoelectronic devices
Photodiodes
Random noise
Semiconductor device noise
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Sensors
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Description
Summary:A high-sensitivity CMOS image sensor using gain-adaptive column amplifiers is presented and tested. The use of high gain for the column amplifier reduces input-referred random noise, and when coupled with a column-based digital noise cancellation technique, also reduces fixed pattern noise. An experimental application of the circuit using 0.25-/spl mu/m CMOS technology with pinned photodiodes gave an rms random noise of 263 /spl mu/V and an rms fixed pattern noise of 50 /spl mu/V.
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.2005.845969