A systematic series of ‘model’ PTMO based segmented polyurethanes reinvestigated using atomic force microscopy

• Published in: Polymer (Guilford) 2003-11, Vol.44 (23), p.7221-7228
• Main Authors: Aneja, Ashish, Wilkes, Garth L.
• Format: Article
• Language: English
• Subjects: Applied sciences; Atomic force microscopy; Exact sciences and technology; Microphase separation; Organic polymers; Physicochemistry of polymers; Polyurethanes; Properties and characterization; Structure, morphology and analysis
• ISSN: 0032-3861; 1873-2291
• DOI: 10.1016/j.polymer.2003.07.007

Approximately 30 years after their preparation, the nanoscale morphology of a series of ‘model’ segmented polyurethane elastomers has been further elucidated using the technique of tapping mode AFM. The materials investigated are based on 1,4-butanediol extended piperazine based hard segments and employ poly(tetramethylene oxide) soft segments. The chemistry of these polyurethanes was specifically controlled in a manner which yielded monodisperse hard segments precisely containing either one, two, three, or four repeating units. Phase images obtained via AFM, for the first time, enable visual representation of the microphase separated morphology of these materials. AFM images also confirmed the presence of a spherulitic morphology, as shown several years ago using SALS and SEM. In addition, applying AFM to films of freshly prepared solution cast samples, the observed lath-like hard domains are suggested to preferentially orient with their long axis along the radial direction of the spherulites, while the respective crystalline hard segments comprising the hard domains are, in turn, preferentially oriented perpendicular to the spherulitic radius. The hard domain connectivity was found to increase with increasing percentage hard segment content of the polymers.