The software tool for lattice parameters determination from nanoareas using CBED patterns

The higher-order Laue zone lines often visible in the central discs of convergent-beam electron diffraction patterns are sensitive to small changes in the lattice parameters in nanoareas. A computer program for the determination of the lattice parameters in the regions of the deformed lattice, espec...

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Bibliographic Details
Published in:Materials chemistry and physics 2003-08, Vol.81 (2-3), p.233-236
Main Authors: Paczkowski, P, Gigla, M, Kostka, A, Morawiec, H
Format: Article
Language:English
Subjects:
CBED
Composite materials
Computer modelling and simulation
Condensed matter: structure, mechanical and thermal properties
Electron diffraction
Electron, ion, and scanning probe microscopy
Exact sciences and technology
Lattice parameter determination
Physics
Structure of solids and liquids
crystallography
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Summary:The higher-order Laue zone lines often visible in the central discs of convergent-beam electron diffraction patterns are sensitive to small changes in the lattice parameters in nanoareas. A computer program for the determination of the lattice parameters in the regions of the deformed lattice, especially near to an interface, is presented.
ISSN:0254-0584
1879-3312
DOI:10.1016/S0254-0584(02)00557-6