Minimizing the uncertainties associated with the measurement of thermal properties by the Transient thermo-reflectance method

An approach for optimizing the transient thermo-reflectance (TTR) measurement of thermal properties is presented. The influence of the most important parameters of the system on the accuracy of the TTR measurements is investigated. An overall performance criterion is defined based on the responsivit...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on components and packaging technologies 2005-03, Vol.28 (1), p.39-44
Main Authors: Burzo, M.G., Komarov, P.L., Raad, P.E.
Format: Article
Language:English
Subjects:
Accuracy
Coefficients
Conducting materials
Conductivity measurement
Criteria
Dielectric measurements
Heating
Interface resistance
laser-based
non-invasive
Optical films
Optical materials
Optimization
Packaging
Pulse measurements
responsivity
Thermal conductivity
thermal conductivity measurement
Thermal properties
Thermoreflectance
thermoreflectance coefficient
transient thermo-reflectance (TTR)
Ultrafast optics
Uncertainty
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:An approach for optimizing the transient thermo-reflectance (TTR) measurement of thermal properties is presented. The influence of the most important parameters of the system on the accuracy of the TTR measurements is investigated. An overall performance criterion is defined based on the responsivity of a given system and the thermoreflectance coefficient of the sample under test. It is shown that in order to obtain the smallest measurement uncertainty one should use a metallic absorption layer with the highest possible thermoreflectance coefficient and then compute the optimum thickness of that layer by maximizing the responsivity of the TTR system. The responsivity represents the sensitivity of the TTR method to the measurement of the thermal properties of a sample and relates the overall uncertainty of a TTR measurement to the uncertainties associated with the TTR apparatus.
ISSN:1521-3331
1557-9972
DOI:10.1109/TCAPT.2004.843189