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NDE of defects in Superconducting wires using SQUID microscopy
Using a scanning Superconducting Quantum Interference Device (SQUID) microscope we have examined small samples of Nb-Ti wire with known defects and a sample with artificial defects. We orient the SQUID to measure the field parallel to the wire, which is near zero unless a defect is present. We also...
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Published in: | IEEE transactions on applied superconductivity 2005-06, Vol.15 (2), p.707-710 |
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container_end_page | 710 |
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container_title | IEEE transactions on applied superconductivity |
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creator | Su-Young Lee Viswanathan, V. Huckans, J. Matthews, J. Wellstood, F.C. |
description | Using a scanning Superconducting Quantum Interference Device (SQUID) microscope we have examined small samples of Nb-Ti wire with known defects and a sample with artificial defects. We orient the SQUID to measure the field parallel to the wire, which is near zero unless a defect is present. We also have examined known defects using a multi-channel scanning SQUID microscope. In addition, we have modified the nose cone of our SQUID microscope to enable fast NDE of long wires by positioning a thin tube immediately beneath the SQUID chip, while feeding the wire through the tube. |
doi_str_mv | 10.1109/TASC.2005.850020 |
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subjects | Applied sciences Copper Defects Electrical engineering. Electrical power engineering Electronics Exact sciences and technology Interference Magnetic field measurement Magnetic resonance imaging Materials Microscopes Microscopy MRI NDE Nondestructive testing SQUID SQUIDs Superconducting coils Superconducting filaments and wires Superconducting magnets Superconducting quantum interference devices superconducting wire Superconductivity Testing, measurement, noise and reliability Tubes Wire |
title | NDE of defects in Superconducting wires using SQUID microscopy |
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