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Crystalline morphologies in segmented copolymers with hard segments of uniform length

The crystal morphological properties of segmented poly(ether ester aramide) elastomers with aromatic hard‐segment amide units of uniform length were studied. Four samples with hard‐segment fractions ranging from 3.4 to 9 wt % were studied by tapping atomic force microscopy (AFM). For one sample, bot...

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Published in:Journal of polymer science. Part B, Polymer physics Polymer physics, 2004-05, Vol.42 (9), p.1783-1792
Main Authors: Sauer, Bryan B., McLean, R. Scott, Gaymans, Reinoud J., Niesten, Meike C. J. E.
Format: Article
Language:English
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Summary:The crystal morphological properties of segmented poly(ether ester aramide) elastomers with aromatic hard‐segment amide units of uniform length were studied. Four samples with hard‐segment fractions ranging from 3.4 to 9 wt % were studied by tapping atomic force microscopy (AFM). For one sample, both solution and melt‐processed surfaces were examined, and similar crystal morphologies were found. The semicrystalline morphologies of these polymers had some similarities to other low‐hard‐segment segmented elastomers. The very thin needlelike or ribbonlike crystallites at the surface had a high aspect ratio for all the samples. The main difference observed for the different compositions was a decrease in the surface area density of ribbons with a decrease in the hard‐segment fraction. One sample was chosen for in situ AFM studies during film extension. The details of the crystallite orientation and breakup were studied in increments up to 700% elongation (8× stretch ratio) and after relaxation. © 2004 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 42: 1783–1792, 2004
ISSN:0887-6266
1099-0488
DOI:10.1002/polb.20060