Observation of single event upsets in analog microcircuits

Selected analog devices were tested for heavy-ion-induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptib...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1993-12, Vol.40 (6), p.1838-1844
Main Authors: Koga, R., Pinkerton, S.D., Moss, S.C., Mayer, D.C., LaLumondiere, S., Hansel, S.J., Crawford, K.B., Crain, W.R.
Format: Article
Language:English
Subjects:
Aerospace testing
Applied sciences
Circuit testing
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Extraterrestrial measurements
Integrated circuits
Laboratories
Operational amplifiers
Pulse amplifiers
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Single event transient
Single event upset
System testing
Voltage
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Summary:Selected analog devices were tested for heavy-ion-induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU in the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are also discussed.< >
ISSN:0018-9499
1558-1578
DOI:10.1109/23.273472