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Effect of rare earth (La, Nd, Sm, Eu, Gd, Dy, Er and Yb) ion substitutions on the microstructural and electrical properties of sol-gel grown PZT ceramics

Polycrystalline samples of (Pb 0.92R 0.08)(Zr 0.6Ti 0.4) 0.98O 3 (R=La, Nd, Sm, Eu, Gd, Dy, Er and Yb) (PRZT) were sol-gel grown. The structural and microstructural properties of the compounds were examined through XRD, SEM, and TEM techniques. Detail analyses of the dielectric constant at different...

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Bibliographic Details
Published in:Journal of the European Ceramic Society 2004, Vol.24 (1), p.163-170
Main Authors: Shannigrahi, S.R., Tay, F.E.H., Yao, K., Choudhary, R.N.P.
Format: Article
Language:English
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Summary:Polycrystalline samples of (Pb 0.92R 0.08)(Zr 0.6Ti 0.4) 0.98O 3 (R=La, Nd, Sm, Eu, Gd, Dy, Er and Yb) (PRZT) were sol-gel grown. The structural and microstructural properties of the compounds were examined through XRD, SEM, and TEM techniques. Detail analyses of the dielectric constant at different temperatures (30–430 °C) at 10 4 Hz suggest that the compounds (except Yb doped PZT) undergo diffuse phase transition of the second order. Piezoelectric and polarization studies provided some interesting physical parameters useful for device applications.
ISSN:0955-2219
1873-619X
DOI:10.1016/S0955-2219(03)00316-9