Submillimeter-spatial-resolution φ-OFDR strain sensor using femtosecond laser induced permanent scatters

A φ-optical frequency domain reflectometry (OFDR) strain sensor with a submillimeter-spatial-resolution of 233 µm is demonstrated by using femtosecond laser induced permanent scatters (PSs) in a standard single-mode fiber (SMF). The PSs-inscribed SMF, i.e., strain sensor, with an interval of 233 µm...

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Bibliographic Details
Published in:Optics letters 2022-12, Vol.47 (23), p.6289-6292
Main Authors: Meng, Yanjie, Fu, Cailing, Chen, Lin, Du, Chao, Zhong, Huajian, Wang, Yiping, He, Jun, Bao, Weijia
Format: Article
Language:English
Subjects:
Backscattering
Insertion loss
Optical frequency
Spatial resolution
Strain distribution
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Summary:A φ-optical frequency domain reflectometry (OFDR) strain sensor with a submillimeter-spatial-resolution of 233 µm is demonstrated by using femtosecond laser induced permanent scatters (PSs) in a standard single-mode fiber (SMF). The PSs-inscribed SMF, i.e., strain sensor, with an interval of 233 µm exhibited a Rayleigh backscattering intensity (RBS) enhancement of 26 dB and insertion loss of 0.6 dB. A novel, to the best of our knowledge, method, i.e., PSs-assisted φ-OFDR, was proposed to demodulate the strain distribution based on the extracted phase difference of P- and S-polarized RBS signal. The maximum measurable strain was up to 1400 µε at a spatial resolution of 233 µm.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.476349