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Local effects in strained manganite thin films

We report on polarized X-ray absorption spectroscopy (P-XAS) study of La 0.7Sr 0.3MnO 3 (LSMO) films, epitaxially grown by laser ablation on tensile (SrTiO 3) and compressive (LaAlO 3) substrates. In-plane and out-of-plane bond information was obtained by setting the angle between electric field vec...

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Bibliographic Details
Published in:Journal of alloys and compounds 2004-04, Vol.369 (1), p.205-208
Main Authors: Souza-Neto, N.M., Ramos, A.Y., Tolentino, H.C.N., Favre-Nicolin, E., Ranno, L.
Format: Article
Language:English
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Summary:We report on polarized X-ray absorption spectroscopy (P-XAS) study of La 0.7Sr 0.3MnO 3 (LSMO) films, epitaxially grown by laser ablation on tensile (SrTiO 3) and compressive (LaAlO 3) substrates. In-plane and out-of-plane bond information was obtained by setting the angle between electric field vector and film surface close to 0 and 90°, respectively. Measurements show significant modifications in the average MnO 6 octahedron around manganese atoms in the film plane for tensile and compressive substrates. The modifications of the XANES spectra were correlated to a modification in the average MnO distance and a distortion of the MnO 6 octahedra. Ab initio calculations using the full multiple scattering approach confirm the structural model of distorted octahedron.
ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2003.09.085