Calculations of the sensitivity function for a mis-aligned thin film in a Mallinson coil set

Studies the accuracy of angular calibrations for VSM measurements on a thin film sample in the presence of misalignments have been performed by computations of the sensitivity function. The pick-up coils are the usual Mallison-type. For a square thin-film sample with dimensions of 4 mm/spl times/4 m...

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Published in:IEEE transactions on magnetics 1994-11, Vol.30 (6), p.4584-4586
Main Author: Hsu, Shau-Wei
Format: Article
Language:English
Subjects:
Anisotropic magnetoresistance
Calibration
Coils
Error correction
Magnetic fields
Magnetic films
Magnetic moments
Measurement standards
Performance evaluation
Transistors
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description Studies the accuracy of angular calibrations for VSM measurements on a thin film sample in the presence of misalignments have been performed by computations of the sensitivity function. The pick-up coils are the usual Mallison-type. For a square thin-film sample with dimensions of 4 mm/spl times/4 mm, the errors due to displacements or off-center rotations of the thin film sample are lower than 5% for all rotation angles if the mis-alignments are controlled to within 1 mm. They increase rapidly, however, if the positional misalignments are larger than 1 mm. If the alignment is performed carefully, the errors caused by tilting the thin film sample is less than 1%. Constraints on the edge length of the thin film is also useful in preventing excessive errors.< >
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source IEEE Electronic Library (IEL) Journals
subjects Anisotropic magnetoresistance
Calibration
Coils
Error correction
Magnetic fields
Magnetic films
Magnetic moments
Measurement standards
Performance evaluation
Transistors
title Calculations of the sensitivity function for a mis-aligned thin film in a Mallinson coil set
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