A double-sided silicon strip detector with capacitive readout and a new method of integrated bias coupling

A novel biasing concept made it possible to implement capacitive coupling in a double-sided silicon strip detector system with a relatively simple production process. Capacitive coupling eliminates the problem of electronic readout saturation caused by leaky strips. This advantage is of particular v...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1989-02, Vol.36 (1), p.251-255
Main Authors: Holl, P., Kemmer, J., Prechtel, U., Ziemann, T., Hauff, D., Lutz, G., Schwarz, A.
Format: Article
Language:English
Subjects:
Current measurement
Detectors
Electronic equipment testing
Particle measurements
Production systems
Readout electronics
Scattering
Silicon
Strips
Voltage
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Summary:A novel biasing concept made it possible to implement capacitive coupling in a double-sided silicon strip detector system with a relatively simple production process. Capacitive coupling eliminates the problem of electronic readout saturation caused by leaky strips. This advantage is of particular value for the n-side, where a current caused by differences in the input voltage levels of the readout electronics could make any measurements impossible. Double-sided readout increases the position information and is advantageous for use in detector systems where compactness and minimization of scattering material are important. Static measurements have confirmed all the principal performance properties of the device. Further tests were performed in the readout electronics environment of the ALEPH minivertex detector under laboratory and operating conditions in a test beam at the CERN SPS and have confirmed the detector's performance.< >
ISSN:0018-9499
1558-1578
DOI:10.1109/23.34444