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Conductive buffer layers and overlayers for the thermal stability of coated conductors
We analyze fundamental issues related to the thermal and electrical stability of a coated conductor during its operation. We address the role of conductive buffer layers in the stability of Ni-based coated conductors, and the effect of a metallic cap layer on the electrical properties of Ni alloy-ba...
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Published in: | IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.3309-3312 |
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container_end_page | 3312 |
container_issue | 1 |
container_start_page | 3309 |
container_title | IEEE transactions on applied superconductivity |
container_volume | 11 |
creator | Cantoni, C. Aytug, T. Verebelyi, D.T. Paranthaman, M. Specht, E.D. Norton, D.P. Christen, D.K. |
description | We analyze fundamental issues related to the thermal and electrical stability of a coated conductor during its operation. We address the role of conductive buffer layers in the stability of Ni-based coated conductors, and the effect of a metallic cap layer on the electrical properties of Ni alloy-based superconducting tapes. For the first case we report on the fabrication of a fully conductive RABiTS architecture formed of bilayers of conductive oxides SrRuO/sub 3/ and LaNiO/sub 3/ on textured Ni tapes. For the second case we discuss measurements of current-voltage relations on Ag/YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// and Cu/Ag/YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// prototype multilayers on insulating substrates. Limitations on the overall tape structure and properties that are posed by the stability requirement are presented. |
doi_str_mv | 10.1109/77.919770 |
format | article |
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We address the role of conductive buffer layers in the stability of Ni-based coated conductors, and the effect of a metallic cap layer on the electrical properties of Ni alloy-based superconducting tapes. For the first case we report on the fabrication of a fully conductive RABiTS architecture formed of bilayers of conductive oxides SrRuO/sub 3/ and LaNiO/sub 3/ on textured Ni tapes. For the second case we discuss measurements of current-voltage relations on Ag/YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// and Cu/Ag/YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// prototype multilayers on insulating substrates. Limitations on the overall tape structure and properties that are posed by the stability requirement are presented.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/77.919770</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Buffer layers ; COATINGS ; Conductors ; COPPER OXIDE ; Current measurement ; ELECTRICAL CONDUCTIVITY ; ELECTRICAL CONDUCTORS ; Electrical engineering. Electrical power engineering ; Exact sciences and technology ; Fabrication ; Materials ; Multilayers ; Nickel ; Nickel alloys ; OXIDES ; Prototypes ; Silver ; Stability ; Stability analysis ; Superconducting films ; Superconducting tapes ; TAPE ; Thermal conductivity ; THERMAL STABILITY ; YTTRIUM OXIDE</subject><ispartof>IEEE transactions on applied superconductivity, 2001-03, Vol.11 (1), p.3309-3312</ispartof><rights>2001 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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We address the role of conductive buffer layers in the stability of Ni-based coated conductors, and the effect of a metallic cap layer on the electrical properties of Ni alloy-based superconducting tapes. For the first case we report on the fabrication of a fully conductive RABiTS architecture formed of bilayers of conductive oxides SrRuO/sub 3/ and LaNiO/sub 3/ on textured Ni tapes. For the second case we discuss measurements of current-voltage relations on Ag/YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// and Cu/Ag/YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// prototype multilayers on insulating substrates. Limitations on the overall tape structure and properties that are posed by the stability requirement are presented.</description><subject>Applied sciences</subject><subject>Buffer layers</subject><subject>COATINGS</subject><subject>Conductors</subject><subject>COPPER OXIDE</subject><subject>Current measurement</subject><subject>ELECTRICAL CONDUCTIVITY</subject><subject>ELECTRICAL CONDUCTORS</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Exact sciences and technology</subject><subject>Fabrication</subject><subject>Materials</subject><subject>Multilayers</subject><subject>Nickel</subject><subject>Nickel alloys</subject><subject>OXIDES</subject><subject>Prototypes</subject><subject>Silver</subject><subject>Stability</subject><subject>Stability analysis</subject><subject>Superconducting films</subject><subject>Superconducting tapes</subject><subject>TAPE</subject><subject>Thermal conductivity</subject><subject>THERMAL STABILITY</subject><subject>YTTRIUM OXIDE</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqN0ctKxDAUBuAiCo6XhVtXRUF00TFJm9tSBm8w4EbdhjQ5wQ6dRpNWmLc3YwcFF-oinIR8-U9IsuwIoynGSF5yPpVYco62sgmmVBSEYrqd5ojiQhBS7mZ7MS4QwpWo6CR7nvnODqZv3iGvB-cg5K1eQYi57mzu3yFsls6HvH-B9QhL3eax13XTNv0q9y43XvdgU_nM8iEeZDtOtxEON3U_e7q5fpzdFfOH2_vZ1bwwFeF9oa0DR4wWtWWcSlMjQRwXzqa7Scm0lVbWdU0cQoCw0EQix1lVAuIaAdByPzsbc1-Dfxsg9mrZRANtqzvwQ1REcEZJWf0DEoKZlH9DxqgkDCV4_ivEjONSMkHWzU9-0IUfQpceRqWOTJayJAldjMgEH2MAp15Ds9RhpTBS679VnKvxb5M93QTqaHTrgu5ME78OSJZ4mdTxqBoA-N4cIz4AN-eq3Q</recordid><startdate>20010301</startdate><enddate>20010301</enddate><creator>Cantoni, C.</creator><creator>Aytug, T.</creator><creator>Verebelyi, D.T.</creator><creator>Paranthaman, M.</creator><creator>Specht, E.D.</creator><creator>Norton, D.P.</creator><creator>Christen, D.K.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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We address the role of conductive buffer layers in the stability of Ni-based coated conductors, and the effect of a metallic cap layer on the electrical properties of Ni alloy-based superconducting tapes. For the first case we report on the fabrication of a fully conductive RABiTS architecture formed of bilayers of conductive oxides SrRuO/sub 3/ and LaNiO/sub 3/ on textured Ni tapes. For the second case we discuss measurements of current-voltage relations on Ag/YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// and Cu/Ag/YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// prototype multilayers on insulating substrates. Limitations on the overall tape structure and properties that are posed by the stability requirement are presented.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/77.919770</doi><tpages>4</tpages></addata></record> |
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subjects | Applied sciences Buffer layers COATINGS Conductors COPPER OXIDE Current measurement ELECTRICAL CONDUCTIVITY ELECTRICAL CONDUCTORS Electrical engineering. Electrical power engineering Exact sciences and technology Fabrication Materials Multilayers Nickel Nickel alloys OXIDES Prototypes Silver Stability Stability analysis Superconducting films Superconducting tapes TAPE Thermal conductivity THERMAL STABILITY YTTRIUM OXIDE |
title | Conductive buffer layers and overlayers for the thermal stability of coated conductors |
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