Elaboration and characterizations of oligoaniline thin films

• Published in: Thin solid films 2004-06, Vol.458 (1), p.32-36
• Main Authors: Poncet, M., Corraze, B., Quillard, S., Wang, W., Macdiarmid, A.G.
• Format: Article
• Language: English
• Subjects: Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Evaporation; Exact sciences and technology; Infrared spectroscopy; Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Organic substances; Physics; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Vapor phase epitaxy; growth from vapor phase; X-Ray diffraction
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2003.11.314

Thin films of vacuum sublimated [4-(phenylamino) phenyl]-1,4-benzenediamine were elaborated by changing deposition parameters. The influence of these parameters on the structural organization of the films is studied by several techniques, such as X-ray diffraction, Scanning Electron Microscopy, UV–vis–NIR optical and polarized infrared absorption. All these results are discussed by comparison to a similar previous study of N, N′-diphenyl-1,4-phenylenediamine and reveal that, using convenient deposition parameters, one can obtain textured films, in which the organic molecules stand almost perpendicular to the substrate. Preliminary doping experiment of these films is presented in the aim of potential use in sensor devices.