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Low-density polyethylene films doped with europium(III) complex: their properties and applications
Light‐converting polyethylene film containing europium(III) complex with phenanthroline was manufactured under an extrusion process. The film was characterized first by means of time‐of‐flight secondary‐ion‐mass spectrometry (TOF‐SIMS), ultraviolet‐visible‐infrared (UV‐vis‐IR) spectroscopy, then a s...
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Published in: | Polymers for advanced technologies 2004-07, Vol.15 (7), p.414-418 |
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container_title | Polymers for advanced technologies |
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creator | Pogreb, Roman Finkelshtein, Binyamin Shmukler, Yuri Musina, Albina Popov, Oleg Stanevsky, Oleg Yitzchaik, Shlomo Gladkikh, Alexander Shulzinger, Alexander Streltsov, Vladimir Davidov, Dan Bormashenko, Edward |
description | Light‐converting polyethylene film containing europium(III) complex with phenanthroline was manufactured under an extrusion process. The film was characterized first by means of time‐of‐flight secondary‐ion‐mass spectrometry (TOF‐SIMS), ultraviolet‐visible‐infrared (UV‐vis‐IR) spectroscopy, then a study of excitation and luminescence spectra, quantum yield and lifetime of luminescence. The quantum yield of luminescence was measured as 5±2%, and the lifetime of luminescence was determined about 470 μsec. TOF‐SIMS surface mapping showed the uniform distribution of europium(III) over the film. Visualization of strong picosecond UV laser beams through the use of the developed film has been demonstrated. Copyright © 2004 John Wiley & Sons, Ltd. |
doi_str_mv | 10.1002/pat.488 |
format | article |
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Adv. Technol</addtitle><date>2004-07</date><risdate>2004</risdate><volume>15</volume><issue>7</issue><spage>414</spage><epage>418</epage><pages>414-418</pages><issn>1042-7147</issn><eissn>1099-1581</eissn><abstract>Light‐converting polyethylene film containing europium(III) complex with phenanthroline was manufactured under an extrusion process. The film was characterized first by means of time‐of‐flight secondary‐ion‐mass spectrometry (TOF‐SIMS), ultraviolet‐visible‐infrared (UV‐vis‐IR) spectroscopy, then a study of excitation and luminescence spectra, quantum yield and lifetime of luminescence. The quantum yield of luminescence was measured as 5±2%, and the lifetime of luminescence was determined about 470 μsec. TOF‐SIMS surface mapping showed the uniform distribution of europium(III) over the film. Visualization of strong picosecond UV laser beams through the use of the developed film has been demonstrated. Copyright © 2004 John Wiley & Sons, Ltd.</abstract><cop>Chichester, UK</cop><pub>John Wiley & Sons, Ltd</pub><doi>10.1002/pat.488</doi><tpages>5</tpages></addata></record> |
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subjects | europium extrusion luminescence polyethylene (PE) spectrum visualization |
title | Low-density polyethylene films doped with europium(III) complex: their properties and applications |
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