Domain wall motion in RE-TM films with different thickness

A thermally activated domain wall motion is studied in amorphous TbFe films with different thicknesses. The activation energy of the domain wall displacement process is determined for the films with various composition and thicknesses. It is about 2.5 eV. The activation volume of this process nonlin...

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Bibliographic Details
Published in:IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) 1993-11, Vol.29 (6), p.2536-2538
Main Authors: Pokhil, T.G., Nikolaev, E.N.
Format: Article
Language:English
Subjects:
360104 - Metals & Alloys- Physical Properties
ALLOYS
Amorphous materials
AMORPHOUS STATE
Chemicals
Coercive force
CRITICAL FIELD
Crystalline materials
DATA
DOMAIN STRUCTURE
Equations
EXPERIMENTAL DATA
INFORMATION
IRON ALLOYS
MAGNETIC FIELDS
Magnetic films
MAGNETIZATION
MATERIALS SCIENCE
NUMERICAL DATA
Optical films
Physics
RARE EARTH ALLOYS
Shape
Temperature dependence
TERBIUM ALLOYS
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Summary:A thermally activated domain wall motion is studied in amorphous TbFe films with different thicknesses. The activation energy of the domain wall displacement process is determined for the films with various composition and thicknesses. It is about 2.5 eV. The activation volume of this process nonlinearly increases from 2*10/sup -18/ cm/sup 3/ to 7*10/sup -18/ cm/sup 3/ as the film thickness increases from 25 nm to 400 nm. The change of the domain shape with the film thickness growth and domain wall coercive force dependence on film thickness are discussed in terms of thermoactivated domain wall motion.< >
ISSN:0018-9464
1941-0069
DOI:10.1109/20.280962