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Development of single solution buffer layers on textured Ni substrate for HTS coated conductors
Much effort has recently been made to develop chemical methods for the manufacturing of coated conductors because of their scalability, low cost and high deposition rate. In this research, epitaxial buffer layers of Gd/sub 2/Zr/sub 2/O/sub 7/ (GZO) have been grown on Ni substrates using a newly deve...
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Published in: | IEEE transactions on applied superconductivity 2005-06, Vol.15 (2), p.2711-2714 |
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creator | Zhou, Y.X. Zhang, X. Fang, H. Putman, P.T. Salama, K. |
description | Much effort has recently been made to develop chemical methods for the manufacturing of coated conductors because of their scalability, low cost and high deposition rate. In this research, epitaxial buffer layers of Gd/sub 2/Zr/sub 2/O/sub 7/ (GZO) have been grown on Ni substrates using a newly developed metal organic decomposition (MOD) approach. The solution prepared from metal-organic precursors was deposited on Ni substrates using the dip coating technique and then was annealed at a high temperature. Texture analysis shows full-width-at-half-maximum (FWHM) values for out-of-plane and in-plane alignments as 6.5/spl deg/ and 8.1/spl deg/, respectively. Pole figure studies indicate a single cube-on-cube texture while SEM micrographs reveal a dense, continuous, and crack-free buffer layer. MOCVD was used to grow 1 /spl mu/m YBCO film on this GZO buffered Ni substrate. A critical current, J/sub c/, of about 1.3 MA/cm/sup 2/ at 77 K and self-field was obtained on YBCO (MOCVD)/GZO(MOD)/Ni. These results give promise to using a single buffer layer for scalable coated conductors. |
doi_str_mv | 10.1109/TASC.2005.847792 |
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In this research, epitaxial buffer layers of Gd/sub 2/Zr/sub 2/O/sub 7/ (GZO) have been grown on Ni substrates using a newly developed metal organic decomposition (MOD) approach. The solution prepared from metal-organic precursors was deposited on Ni substrates using the dip coating technique and then was annealed at a high temperature. Texture analysis shows full-width-at-half-maximum (FWHM) values for out-of-plane and in-plane alignments as 6.5/spl deg/ and 8.1/spl deg/, respectively. Pole figure studies indicate a single cube-on-cube texture while SEM micrographs reveal a dense, continuous, and crack-free buffer layer. MOCVD was used to grow 1 /spl mu/m YBCO film on this GZO buffered Ni substrate. A critical current, J/sub c/, of about 1.3 MA/cm/sup 2/ at 77 K and self-field was obtained on YBCO (MOCVD)/GZO(MOD)/Ni. These results give promise to using a single buffer layer for scalable coated conductors.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2005.847792</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>ANNEALING PROCESSES ; Applied sciences ; Buffer layers ; Buffers ; Chemicals ; coated conductor ; COATINGS ; Conductors ; COPPER OXIDE ; Costs ; CRYSTAL GROWTH ; DEPOSITION ; Electric connection. Cables. Wiring ; ELECTRICAL CONDUCTORS ; Electrical engineering. Electrical power engineering ; Electronics ; EPITAXY ; Exact sciences and technology ; High temperature superconductors ; Manufacturing ; Microelectronic fabrication (materials and surfaces technology) ; MOCVD ; Nickel ; Pole figures ; Scalability ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Solar energy ; Substrates ; SUPERCONDUCTORS ; Surface layer ; Texture ; TEXTURES ; Thin films ; Various equipment and components ; YBCO ; YBCO superconductors ; Yttrium barium copper oxide</subject><ispartof>IEEE transactions on applied superconductivity, 2005-06, Vol.15 (2), p.2711-2714</ispartof><rights>2005 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c414t-ac2e7fe57c9fd907ae4c3bd7f27b9cf361711003bc1f6017570919510ff4edc63</citedby><cites>FETCH-LOGICAL-c414t-ac2e7fe57c9fd907ae4c3bd7f27b9cf361711003bc1f6017570919510ff4edc63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1440227$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,23928,23929,25138,27922,27923,54794</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16924369$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Zhou, Y.X.</creatorcontrib><creatorcontrib>Zhang, X.</creatorcontrib><creatorcontrib>Fang, H.</creatorcontrib><creatorcontrib>Putman, P.T.</creatorcontrib><creatorcontrib>Salama, K.</creatorcontrib><title>Development of single solution buffer layers on textured Ni substrate for HTS coated conductors</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>Much effort has recently been made to develop chemical methods for the manufacturing of coated conductors because of their scalability, low cost and high deposition rate. In this research, epitaxial buffer layers of Gd/sub 2/Zr/sub 2/O/sub 7/ (GZO) have been grown on Ni substrates using a newly developed metal organic decomposition (MOD) approach. The solution prepared from metal-organic precursors was deposited on Ni substrates using the dip coating technique and then was annealed at a high temperature. Texture analysis shows full-width-at-half-maximum (FWHM) values for out-of-plane and in-plane alignments as 6.5/spl deg/ and 8.1/spl deg/, respectively. Pole figure studies indicate a single cube-on-cube texture while SEM micrographs reveal a dense, continuous, and crack-free buffer layer. MOCVD was used to grow 1 /spl mu/m YBCO film on this GZO buffered Ni substrate. A critical current, J/sub c/, of about 1.3 MA/cm/sup 2/ at 77 K and self-field was obtained on YBCO (MOCVD)/GZO(MOD)/Ni. These results give promise to using a single buffer layer for scalable coated conductors.</description><subject>ANNEALING PROCESSES</subject><subject>Applied sciences</subject><subject>Buffer layers</subject><subject>Buffers</subject><subject>Chemicals</subject><subject>coated conductor</subject><subject>COATINGS</subject><subject>Conductors</subject><subject>COPPER OXIDE</subject><subject>Costs</subject><subject>CRYSTAL GROWTH</subject><subject>DEPOSITION</subject><subject>Electric connection. Cables. Wiring</subject><subject>ELECTRICAL CONDUCTORS</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electronics</subject><subject>EPITAXY</subject><subject>Exact sciences and technology</subject><subject>High temperature superconductors</subject><subject>Manufacturing</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>MOCVD</subject><subject>Nickel</subject><subject>Pole figures</subject><subject>Scalability</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Solar energy</subject><subject>Substrates</subject><subject>SUPERCONDUCTORS</subject><subject>Surface layer</subject><subject>Texture</subject><subject>TEXTURES</subject><subject>Thin films</subject><subject>Various equipment and components</subject><subject>YBCO</subject><subject>YBCO superconductors</subject><subject>Yttrium barium copper oxide</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNqNkU1r3DAQhk1JoUnae6EXUUhz8nZGlizrGLZNUgjtIduzkOVRcfBaG0kuyb-vlg0Ecgg9zdczM8y8VfURYYUI-uvm4na94gBy1QmlNH9THaOUXc0lyqPig8S647x5V52kdAeAohPyuDLf6C9NYbelObPgWRrnPxOxFKYlj2Fm_eI9RTbZR4qJlUSmh7xEGtjPkaWlTznaTMyHyK43t8yFEg3FzMPicojpffXW2ynRhyd7Wv2-_L5ZX9c3v65-rC9uaidQ5No6TsqTVE77QYOyJFzTD8pz1WvnmxZVuRKa3qFvAZVUoFFLBO8FDa5tTqvzw9xdDPcLpWy2Y3I0TXamsCSjUbRCCC0K-eVVkne81VL8D4hYHq0L-PkFeBeWOJdzy1oOnWg0FAgOkIshpUje7OK4tfHRIJi9gmavoNkraA4Klpazp7k2OTv5aGc3pue-VnPRtPv9nw7cSETPZSGAc9X8AwIao-w</recordid><startdate>20050601</startdate><enddate>20050601</enddate><creator>Zhou, Y.X.</creator><creator>Zhang, X.</creator><creator>Fang, H.</creator><creator>Putman, P.T.</creator><creator>Salama, K.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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In this research, epitaxial buffer layers of Gd/sub 2/Zr/sub 2/O/sub 7/ (GZO) have been grown on Ni substrates using a newly developed metal organic decomposition (MOD) approach. The solution prepared from metal-organic precursors was deposited on Ni substrates using the dip coating technique and then was annealed at a high temperature. Texture analysis shows full-width-at-half-maximum (FWHM) values for out-of-plane and in-plane alignments as 6.5/spl deg/ and 8.1/spl deg/, respectively. Pole figure studies indicate a single cube-on-cube texture while SEM micrographs reveal a dense, continuous, and crack-free buffer layer. MOCVD was used to grow 1 /spl mu/m YBCO film on this GZO buffered Ni substrate. A critical current, J/sub c/, of about 1.3 MA/cm/sup 2/ at 77 K and self-field was obtained on YBCO (MOCVD)/GZO(MOD)/Ni. These results give promise to using a single buffer layer for scalable coated conductors.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TASC.2005.847792</doi><tpages>4</tpages></addata></record> |
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subjects | ANNEALING PROCESSES Applied sciences Buffer layers Buffers Chemicals coated conductor COATINGS Conductors COPPER OXIDE Costs CRYSTAL GROWTH DEPOSITION Electric connection. Cables. Wiring ELECTRICAL CONDUCTORS Electrical engineering. Electrical power engineering Electronics EPITAXY Exact sciences and technology High temperature superconductors Manufacturing Microelectronic fabrication (materials and surfaces technology) MOCVD Nickel Pole figures Scalability Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Solar energy Substrates SUPERCONDUCTORS Surface layer Texture TEXTURES Thin films Various equipment and components YBCO YBCO superconductors Yttrium barium copper oxide |
title | Development of single solution buffer layers on textured Ni substrate for HTS coated conductors |
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