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Nanoscale study on origins of the bright clusters in/on moisture-exposed tris(8-hydroxyquinoline) aluminum thin films
By exploiting variable-temperature tapping mode atomic force microscopy (VT-AFM), along with X-ray diffraction (XRD) and Fourier transform infrared spectroscopy, we have systematically investigated the nature of the bright clusters, which can be classified as protrusion and grown grain, in/on the mo...
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Published in: | Synthetic metals 2004-09, Vol.145 (2), p.177-182 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | By exploiting variable-temperature tapping mode atomic force microscopy (VT-AFM), along with X-ray diffraction (XRD) and Fourier transform infrared spectroscopy, we have systematically investigated the nature of the bright clusters, which can be classified as protrusion and grown grain, in/on the moisture-exposed tris(8-hydroxyquinoline) aluminum (Alq
3) thin film. The experimental results suggest that the protrusion is most likely to be a hydrated Alq
3 species, whereas the grown grain is a crystalline Alq
3 structure. Moreover, the evolution of a hydrated Alq
3 species into a dark hole and/or a crystalline Alq
3 structure was in-situ visualized. |
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ISSN: | 0379-6779 1879-3290 |
DOI: | 10.1016/j.synthmet.2004.05.017 |