Huber optimization of circuits: a robust approach

The authors introduce an approach to robust circuit optimization using Huber functions, both two-sided and one-sided. They compare Huber optimization with l/sub 1/, l/sub 2/, and minimax methods in the presence of faults, large and small measurement errors, bad starting points, and statistical uncer...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1993-12, Vol.41 (12), p.2279-2287
Main Authors: Bandler, J.W., Shao Hua Chen, Biernacki, R.M., Li Gao, Madsen, K., Huanyu Yu
Format: Article
Language:English
Subjects:
Applied sciences
Circuit faults
Circuit optimization
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fault location
FETs
Large-scale systems
Measurement errors
Minimax techniques
Multiplexing
Optimization methods
Robustness
Theoretical study. Circuits analysis and design
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Summary:The authors introduce an approach to robust circuit optimization using Huber functions, both two-sided and one-sided. They compare Huber optimization with l/sub 1/, l/sub 2/, and minimax methods in the presence of faults, large and small measurement errors, bad starting points, and statistical uncertainties. They demonstrate FET statistical modeling, multiplexer optimization, analog fault location, and data fitting. They extend the Huber concept by introducing a one-sided Huber function for large-scale optimization. For large-scale problems, the designer often attempts, by intuition, a preliminary optimization by selecting a small number of dominant variables. It is demonstrated, through multiplexer optimization, that the one-sided Huber function can be more effective and efficient than minimax in overcoming a bad starting point.< >
ISSN:0018-9480
1557-9670
DOI:10.1109/22.260718