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EPR-Characterization of Carbon Inclusions in Boron Carbide
In boron carbide, the dependence of EPR line width (ΔB) with g= 2.0028 on the contents of free carbon, cC, is used to determine the surface‐to‐volume ratio (S/V) of free carbon inclusions. Consecutive reduction of cC was conducted by a method of low‐vacuum oxidation at a range of temperatures. The a...
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Published in: | Journal of the American Ceramic Society 2004-07, Vol.87 (7), p.1336-1338 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In boron carbide, the dependence of EPR line width (ΔB) with g= 2.0028 on the contents of free carbon, cC, is used to determine the surface‐to‐volume ratio (S/V) of free carbon inclusions. Consecutive reduction of cC was conducted by a method of low‐vacuum oxidation at a range of temperatures. The amount of a free carbon (a graphite phase) in samples was measured by X‐ray. Analysis of changes in ΔB (cC) has shown that free carbon inclusions at the surface layer of polycrystalline boron carbide particles has S/V two times smaller than that of free carbon inclusions in the interior of polycrystalline boron carbide. |
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ISSN: | 0002-7820 1551-2916 |
DOI: | 10.1111/j.1151-2916.2004.tb07731.x |