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EPR-Characterization of Carbon Inclusions in Boron Carbide

In boron carbide, the dependence of EPR line width (ΔB) with g= 2.0028 on the contents of free carbon, cC, is used to determine the surface‐to‐volume ratio (S/V) of free carbon inclusions. Consecutive reduction of cC was conducted by a method of low‐vacuum oxidation at a range of temperatures. The a...

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Bibliographic Details
Published in:Journal of the American Ceramic Society 2004-07, Vol.87 (7), p.1336-1338
Main Authors: Kakazey, Mykola, Vlasova, Maryna, Gonzalez-Rodriguez, Jose Gonzalo, Dominguez-Patiño, Martha, Leder, Ron
Format: Article
Language:English
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Summary:In boron carbide, the dependence of EPR line width (ΔB) with g= 2.0028 on the contents of free carbon, cC, is used to determine the surface‐to‐volume ratio (S/V) of free carbon inclusions. Consecutive reduction of cC was conducted by a method of low‐vacuum oxidation at a range of temperatures. The amount of a free carbon (a graphite phase) in samples was measured by X‐ray. Analysis of changes in ΔB (cC) has shown that free carbon inclusions at the surface layer of polycrystalline boron carbide particles has S/V two times smaller than that of free carbon inclusions in the interior of polycrystalline boron carbide.
ISSN:0002-7820
1551-2916
DOI:10.1111/j.1151-2916.2004.tb07731.x