Electro-optic sampling system for the testing of high-speed integrated circuits using a free running solid-state laser

This paper deals with the indirect electro-optic sampling technique for the low-invasive detection of periodical voltage waveforms on lines in high-speed integrated circuits. The system introduced here is based on a passive mode-coupled Ti:Sapphire-Laser as light source for generating optical pulses...

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Bibliographic Details
Published in:Journal of lightwave technology 1996-08, Vol.14 (8), p.1788-1793
Main Authors: Hofmann, R., Pfleiderer, H.-J.
Format: Article
Language:English
Subjects:
Applied sciences
Circuit testing
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Frequency synchronization
High speed integrated circuits
Integrated circuits
Light sources
Optical pulse generation
Optical pulses
Pulse measurements
Sampling methods
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
System testing
Voltage
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Summary:This paper deals with the indirect electro-optic sampling technique for the low-invasive detection of periodical voltage waveforms on lines in high-speed integrated circuits. The system introduced here is based on a passive mode-coupled Ti:Sapphire-Laser as light source for generating optical pulses in the subpicosecond regime. Therefore, we have to synchronize the resulting electric measurement signal and its external trigger onto the pulse repetition rate of this free running solid-state laser. The multi user function of the laser system forces us to transmit the pulses via a single-mode fiber into the measurement setup. For that purpose we developed a special optical arrangement to minimize the widening of the pulses in the time domain. The system's high-temporal resolution of nearly 10 ps in combination with its high-voltage sensitivity of about 800 /spl mu/V//spl radic/(Hz) is demonstrated by measurements of an integrated microwave frequency divider.
ISSN:0733-8724
1558-2213
DOI:10.1109/50.532015